| Modeling of smooth spherical nano particle manipulation on a randomly rough surface in pushing purposes based on AFM |
| Paper ID : 1396-ICNS (R1) |
| Authors: |
|
Manijeh Zakeri1, Javad Faraji *2, Elham Baradary3 1Department of Electrical and Computer Engineering/Tabriz University/Tabriz/Iran 2mechanical engineering faculty.university of Tabriz 3Department of Electrical and Computer Engineering/ Tabriz university/Tabriz/Iran |
| Abstract: |
| In this paper, the dynamic behavior of a nanoparticle on a randomly rough surface is pushing based on the atomic force microscopy (AFM) with the JKR contact mechanic was modeled. First, using the Lennard-Jones potential, the adhesion force between the smooth sphere and the random roughness substrate is obtained. Through combining the new model proposed with the JKR contact mechanic, the real contact area and adhesion force for random rough surface were obtained. By using the new contact model, the dynamic manipulation behavior of smooth particle in pushing mode on the rough substrate was modeled. Additionally, simulation of the particle dynamics with radii of 50 in moving on the different rough substrates by assuming random roughness, and smooth substrate was investigated. Results showed profiles of the rough surface and roughness distribution are very important factors in determining the sliding and rolling force. In general, the obtained critical force based on the new random contact model in comparison with those based on the smooth substrate was decreased. |
| Keywords: |
| Nano Manipulation; Randomly Rough Surface; Atomic Force Microscopy (AFM); JKR contact mechanic. |
| Status : Abstract Accepted (Poster Presentation) |