Speed and Accuracy Improvement in Non-Raster Scan Multi-Color Near Field Optical Microscopy
Paper ID : 1395-ICNS
Mehrdad Malekian1, hesam heydarian2, Payam Yazdanfar1, Bizhan Rashidian *1
1Department of Electrical Engineering, Sharif University of Technology
2Department of electrical engineering, sharif university of technology
A non raster scan pattern in multi-color Scanning Near field Optical Microscope (SNOM) for improving speed and accuracy of imaging is presented. Due to the limited bandwidth of the mechanical positioning system, speed of imaging in scanning pattern with high harmonic contents such as raster scan is limited. Using spiral pattern which has better harmonic content this problem can be mitigated. Moreover, by combining the spiral scanning technique with the idea of the parallel imaging in the multi-color probe more significant increases in the speed of imaging is achievable. We show that increasing the frequency of spiral up to 5 times the frequency of raster scanning, and using a multi-color probe can yield an increase of up to 10 times in the scanning speed in comparison with simple raster. Additionally, several crossing points in each periods of scanning provide the ability to compensate unwanted vibrations, thermal drift and piezo creep.
Near field optics; SNOM; nanoscopy; high-speed scanning
Status : Abstract Accepted (Oral Presentation)
8th International Conference on Nanostructures 8th International Conference on Nanostructures